SAM.GOVDue: May 28, 2025 at 04:00 PM UTCIn-ActiveSources SoughtSource Url
Summary
The opportunity titled 'Nanometer Scale Planar Films and Measurements' is a sources sought notice issued by the National Institute of Standards and Technology (NIST) aimed at gathering information from potential contractors who can provide expertise in the development and measurement of nanometer scale planar films. This work is critical for advancing technologies that rely on precise material properties at the nanoscale. Contractors with experience in nanotechnology, materials science, and measurement techniques are encouraged to respond, as this opportunity seeks to identify capable businesses that can meet the specific needs outlined by NIST. The deadline for responses is May 28, 2025, and the work will be performed in Gaithersburg, Maryland.