On-Wafer Probes
SAM.GOV Due: May 28, 2025 at 04:00 PM UTC
In-Active Sources Sought Source Url

Summary

The National Institute of Standards and Technology (NIST) is conducting a Sources Sought announcement to identify potential vendors capable of providing On-Wafer Probes for high-frequency electronics applications. This opportunity is specifically aimed at firms that can supply specialized equipment for on-wafer calibration studies and load-pull measurements up to 220 GHz, as part of various projects including CRADA, CHIPS, and DARPA ELGAR. Contractors with expertise in instrument manufacturing for measuring and testing electricity and electrical signals, particularly those who can meet the detailed specifications outlined in the attached Requirements/Specifications Document, are encouraged to respond. This announcement serves as a market research tool and is not a request for quotations, allowing NIST to assess the availability of small business set-aside opportunities while also welcoming responses from all business sizes.
Description

National Institute of Standards and Technology (NIST)

Acquisition Management Division

Sources Sought for Commercial Item Purchase

THIS SOURCES SOUGHT IS NOT A REQUEST FOR QUOTATION.

It is a market research tool being used to determine pote

Entities
CDO
Department of Commerce
NIOSAT
National Institute of Standards and Technology
NAICS
334515
Set Aside
None
Place of Performance
Boulder , Colorado 80305
Point of Contact
Full Name Email Phone Type
Lia M Arthofer [email protected] 3034973870 primary
Attachments
  • Specifications.pdf