Solicitation for purchase of Semi-Automated Probe Station (CHIPS)
SAM.GOV Due: May 9, 2025 at 03:00 PM UTC
In-Active Combined Synopsis/Solicitation SBA Source Url

Summary

The opportunity involves the procurement of a semi-automated probe station specifically designed for reliability testing of silicon carbide field effect transistors (FETs). This equipment is crucial for the CHIPS R&D Program Office's mission to enhance the reliability of semiconductor devices used in various high-power applications. The contractor will be responsible for providing a new, ultra-dry, semi-automatic wafer probing station that meets detailed technical specifications, including capabilities for probing wafers up to 200 mm in diameter and operating in a controlled environment to prevent contamination. This solicitation is set aside for small businesses, making it an ideal opportunity for contractors specializing in analytical laboratory instruments and semiconductor testing equipment.
Description

Please see attached solicitation document for full details.

Please note that this is 100% set-aside for small business.

Entities
CDO
Department of Commerce
NIOSAT
National Institute of Standards and Technology
NAICS
334516
Set Aside
SBA : Total Small Business Set-Aside (FAR 19.5)
Place of Performance
Gaithersburg , Maryland 20899
Point of Contact
Full Name Email Phone Type
Forest Crumpler [email protected] primary
Attachments
  • Attachment+1-+Statement+of+Work.pdf
  • 1333ND25QNB030150.pdf