Sources Sought Silicon and Silicon/Germanium Epitaxial Wafers
SAM.GOV Due: April 29, 2025 at 03:00 PM UTC
In-Active Sources Sought Source Url

Summary

The opportunity titled 'Sources Sought Silicon and Silicon/Germanium Epitaxial Wafers' is issued by the National Institute of Standards and Technology (NIST) as part of their CHIPS Metrology program. This program aims to enhance metrology capabilities within the U.S. semiconductor manufacturing ecosystem. NIST is seeking potential vendors who can supply high-quality epitaxial film stacks on silicon wafers, with specific requirements for various classes of wafers, including doped silicon and silicon-germanium layers. Contractors with expertise in semiconductor materials and the ability to provide detailed specifications and data, such as Secondary Ion Mass Spectroscopy (SIMS) and Spreading Resistance Profiling (SRP), are encouraged to respond to this sources sought notice. The opportunity is primarily aimed at businesses that can meet the technical specifications and provide the necessary documentation and support for the products offered.
Description

The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs.

BACKGROUND

The CHIPS Metrology program develops and advanc

Entities
CDO
Department of Commerce
NIOSAT
National Institute of Standards and Technology
NAICS
334413
Set Aside
None
Place of Performance
Gaithersburg , Maryland 20899
Point of Contact
Full Name Email Phone Type
Tracy Retterer [email protected] primary
Donald Collie [email protected] secondary