TEM Sample Holder/Scanning Electron Microscopy Stage w/HF capabilities
SAM.GOV Due: June 9, 2025 at 09:00 PM UTC
In-Active Solicitation Source Url

Summary

The opportunity involves the procurement of a Transmission Electron Microscope (TEM) sample holder and a Scanning Electron Microscopy (SEM) stage with high-frequency capabilities, specifically designed for advanced research applications. The TEM holder is required to support thin research samples with features such as electric bias application and temperature control ranging from liquid nitrogen temperatures to 800°C. The SEM stage must facilitate high-frequency excitation experiments and be compatible with the TEM holder. This solicitation is aimed at contractors with expertise in manufacturing specialized scientific equipment, particularly those familiar with MEMS technology and capable of meeting stringent quality assurance standards. Interested bidders should be prepared to provide detailed technical specifications and demonstrate compliance with the outlined requirements in the Statement of Work.
Description

BSA is seeking quotes for the subject line TEM Sample Holder/Scanning Electron Microscopy Stage w/HF capabilities. See attached RFQ letter for details as well as all the attachments herein.

Entities
EDO
Department of Energy
NAICS
335999
Set Aside
None
Place of Performance
Upton , New York 11973
Point of Contact
Full Name Email Phone Type
Eric Nagel [email protected] primary
Attachments
  • Enclosure+%286%29+Form+W-8.pdf
  • Attachment+%28A%29+Statement+of+Work.pdf
  • Attachment+%28B%29+BNL-QA-101.pdf
  • Enclosure+%284%29+Vendor+ACH+Authorization.pdf
  • RFQ+461513.pdf
  • Enclosure+%283%29+AMS+form+50+Reps+and+Certs.pdf
  • Enclosure+%281%29+Draft+Contract+461513.pdf
  • Enclosure+%282%29+Quotation+Pricing+Sheet+AMS-Form-043.pdf
  • Enclosure+%285%29+Form+W-9.pdf
  • Foreign+Clauses+for+Non-Commercial.pdf